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當(dāng)前位置：首頁(yè) > 產(chǎn)品中心 > 二維材料 > 碲化物晶體 > 碲化錫 Sb2Te3
簡(jiǎn)要描述：Powder X-ray diffraction (XRD) of a single crystal Sb2Te3. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.
更新時(shí)間：2024-06-03產(chǎn)品型號(hào)： 廠商性質(zhì)：生產(chǎn)廠家訪 問(wèn) 量：1476詳細(xì)介紹
晶體尺寸：10毫米
電學(xué)性能：半導(dǎo)體，拓?fù)浣^緣體，熱電性
晶體結(jié)構(gòu)：六邊形
晶胞參數(shù)：a = b = 0.425nm，C = 3.048nm，α=β= 90°γ= 120
晶體類(lèi)型：合成
晶體純度：＞99.995%
表征方法：XRD、拉曼、EDX
X-ray diffraction on a Sb2Te3 single crystal aligned along the (001) plane. XRD was performed at room temperature using a D8 Venture Bruker. The 7 XRD peaks correspond, from left to right, to (00l) with l = 6, 9, 12, 15, 18, 21, 24
Powder X-ray diffraction (XRD) of a single crystal Sb2Te3. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.
Stoichiometric analysis of a single crystal Sb2Te3 by Energy-dispersive X-ray spectroscopy (EDX).
Raman spectrum of a single crystal Sb2Te3. Measurement was performed with a 785 nm Raman system at room temperature.
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