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二碲化鉿晶體 HfTe2(Hafnium Telluride)
晶體尺寸：~10毫米
電學性能：半金屬
晶體結(jié)構(gòu)：六邊形
晶胞參數(shù)：a = b = 0.395 nm, c = 0.666 nm, α = β = 90°, γ = 120°
晶體類型：合成
晶體純度：＞99.995%
X-ray diffraction on a HfTe2 single crystal aligned along the (001) plane. XRD was performed at room temperature using a D8 Venture Bruker. The 6 XRD peaks correspond, from left to right, to (00l) with l = 1, 2, 3, 4, 5, 6
Powder X-ray diffraction (XRD) of a single crystal . X-ray diffraction was performed at room temperature using a D8 Venture Bruker.
Stoichiometric analysis of a single crystal by Energy-dispersive X-ray spectroscopy (EDX).
Raman spectrum of a single crystal . Measurement was performed with a 785 nm Raman system at room temperature.
聯(lián)系人：陳谷一
地址：江蘇省泰州市鳳凰西路168號
郵箱：taizhou@sunano.com.cn
電話：021-56830191
